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The probe-card is a crucial part of a wafer test set-up and is the mechanical interface between a test system and the bond-pads on the wafer. Probe-tip misalignment, high contact resistance, and signal leakage will cause inconsistent test results and possibly even rejects. Eliminate this variable by checking and managing the probe-card physical and electrical condition. The Manager V informs you quickly and accurately about the condition of your probe-cards. 

A physical check of the probe-tip locations in 3-D (X/Y/Z) will generate a detailed status report and the necessary repair instructions. Electrical verification informs you about the contact resistance throughout the entire probe-card, all the way to the probe-tip, as well as the leakage between the probe-tips and their connections.  

Our product portfolio consists of 6 products: Supervisor IV, Manager III, Manager V, 3D profiler, Scrubmark analyzer, OS tester. 


Probecard testers5 Products
Probecard tester tools4 Products
Other products3 Products

Most popular products

PRVX Upgrades

PRVX - New computer system with Windows 10 and BE software - Expandable to 9,000 channels - Obsolete electronics...

Supervisor V

Yield problems and inconsistent test results? The probe card is a crucial part of a wafer test set-up. The probe card i...

Manager IV

- System for small probecards with small pincount and small probe area - Depending on the model 750 to 4500 channels...

Manager V

Nowadays, more complex probe cards are being used. More pins, a higher density and a larger array require a new approach...

Inspector 3D Analyser

The INSPECTOR is able to show probe tip wear of the tip shape and will also show how much the probe has moved verticall...

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